silicon carbide schottky rectifier diode semelab limited reserves the right to change test c onditions, parameter limits and package dimensions without notice. information furnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omissions discovered in its use. semelab encourage s customers to verify that datasheets are current before placing a n order. semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb document number 8697 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 1 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 1 of 3 sml05sc12dlcc3 hermetic ceramic surface mount package ?d-5b? / ?e-melf? compatible footprint 1200v, 5a, schottky rectifier zero forward and reverse recovery high frequency operation fast temperature independent switching positive temperature coefficient on vf space level and high-reliability screening options av ailable typical applications applications requiring high voltages low switching l osses and fast switching speeds such as switching p ower supplies, converters, power factor conversion and motor drive an d free wheeling diodes absolute maximum ratings (t j = 25c unless otherwise stated) v rrm repetitive peak reverse voltage 1200v v r dc reverse voltage 1200v v rwm working peak reverse voltage 1200v i f(av) average forward current (tj = 175c) 5a i frm repetitive peak forward surge current (tp = 8ms half sine wave) 30a i fsm non repetitive peak forward surge current (tp = 10s pulse) 100a t j junction temperature range -55 to +175c t stg storage temperature range -55 to +175c electrical characteristics (t j = 25c unless otherwise stated) symbol parameter test conditions min typ max units i f = 5a 1.8 v fm (1) forward voltage drop t j = 175c 3.0 v v r = rated v r 200 a i r reverse leakage current t j = 175c 1.0 ma v r = 500v i f = 1.0a q c total capacitive charge di/dt = 500a/a 28 nc v r = 0v f = 1.0mhz 455 v r = 200v f = 1.0mhz 45 c j junction capacitance v r = 400v f = 1.0mhz 33 pf notes notes notes notes (1) pulse width < 300s, duty cycle <2%
silicon carbide schottky rectifier diode sml05sc12dlcc3 semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb document number 8697 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 1 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 2 of 3 thermal properties symbol parameter max units r jc thermal resistance junction to case tbd c/w mechanical data dimensions in mm (inches) a d c c b 1 2 3 dlcc3 pcb solder pad layout soldering temperature should be 260c for a maximum of 10 seconds. a b c inches mm a 0.288 7.32 b 0.070 1.78 c 0.155 3.94 dlcc3 variant a (d3a) pad 1 anode pad 2 cathode dimension mm inches a 7.00 0.10 0.275 0.004 b 3.65 0.10 0.143 0.004 c 1.60 0.10 0.063 0.004 d 1.76 0.10 0.069 0.004 dlcc3 variant b (d3 b ) pad 1 anode pad 2 cathode pad 3 lid contact to cathode* dimension mm inches a 7.00 0.10 0.275 0.004 b 3.65 0.10 0.143 0.004 c 1.60 0.10 0.063 0.004 d 1.76 0.10 0.069 0.004
silicon carbide schottky rectifier diode sml05sc12dlcc3 semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb document number 8697 telephone +44 (0) 1455 556565 fax +44 (0) 1455 552612 issue 1 email: sales@semelab-tt.com website: http://www.semelab-tt.com page 3 of 3 screening options space level (jqrs/esa) and high reliability options a re available in accordance with the high reliability and screening options handbook available for download from the from the tt electronics semelab web site. esa quality level products are based on the testing procedures specified in the generic escc 5000 and in the corresponding part detail specifications. semelabs qr216 and qr217 processing specifications (jqrs), in conjunction with the companies iso 9001: 2000 approval present a viable alternative to the america n mil- prf-19500 space level processing. qr217 (space level quality conformance) is based on the quality conformance inspection requirements of mil- prf- 19500 groups a (table v), b (table via), c (table vi i) and also esa / escc 5000 (chart f4) lot validation tests. qr216 (space level screening) is based on the scree ning requirements of mil-prf-19500 (table iv) and also e sa /escc 5000 (chart f3). jqrs parts are processed to the device data sheet a nd screened to qr216 with conformance testing to q217 groups a and b in accordance with mil-std-750 method s and procedures. additional conformance options are available, for ex ample pre-cap visual inspection, buy-off visit or data pac ks. these are chargeable and must be specified at the o rder stage (see ordering information). minimum order quantities may apply. alternative or additional customer specific conforma nce or screening requirements would be considered. contact semelab sales with enquires. marking details parts can be marked with approximately 8 characters on two lines and can include the cathode identificatio n. typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. customer specific marking requirements can be arrang ed at the time of order. example marking: ordering information part numbers are built up from type, package varian t, and screening level. the part numbers are extended to i nclude the additional options as shown below. type ? see electrical stability characteristics tab le package variant ? see mechanical data screening level ? see screening options (esa / jqrs) additional options: customer pre-cap visual inspection .cvp customer buy-off visit .cvb data pack .da solderability samples .ss scanning electron microscopy .sem radiography (x-ray) .xray total dose radiation test .rad mil-prf-19500 (qr217) group b charge .grpb group b destructive mechanical samples .gbdm (12 pi eces) group c charge .grpc group c destructive electrical samples .gcde (12 pi eces) group c destructive mechanical samples .gcdm (6 pie ces) esa/escc lot validation testing (subgroup 1) charge .lvt1 lvt1 destructive samples (environmental) .l1de (15 pieces) lvt1 destructive samples (mechanical) .l1dm (15 pie ces) lot validation testing (subgroup 2) charge .lvt2 lvt2 endurance samples (electrical) .l2d (15 pieces ) lot validation testing (subgroup 3) charge .lvt3 lvt3 destructive samples (mechanical) .l3d (5 piece s) additional option notes: 1) all ?additional options? are chargeable and must be specified at order stage. 2) when group b,c or lvt is required, additional el ectrical and mechanical destructive samples must be ordered 3) all destructive samples are marked the same as o ther production parts unless otherwise requested. example ordering information: the following example is for the sml05sc12dlcc3 part with package variant b, jqrs screening, additional group c conformance testing and a data pack. part numbers: sml05sc12d3b-jqrs (include quantity for flight parts) sml05sc12d3b.grpc (chargeable conformance option) sml05sc12d3b.gcde (charge for destructive parts) sml05sc12d3b.gcdm (charge for destructive parts) sml05sc12d3b.da (charge for data pack) customers with any specific requirements (e.g. marki ng or screening) may be supplied with a similar alternati ve part number (there is maximum 20 character limit to part numbers). contact semelab sales with enquiries. high reliability and screening options handbook link : http://www.semelab.co.uk/pdf/misc/documents/hirel_ and_screening_options.pdf
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